On-Line BIST for Testing Analog Circuits

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by J. Velasco-Medina Articles by I. Rayane Articles by M. Nicolaidis

1999 IEEE International Conference on Computer Design (ICCD'99)

Austin, Texas

October 10-October 13

ISBN: 0-7695-0406-X

	ASCII Text	x
	J. Velasco-Medina, I. Rayane, M. Nicolaidis, "On-Line BIST for Testing Analog Circuits," Computer Design, International Conference on, pp. 330, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999.

	BibTex	x
	@article{ 10.1109/ICCD.1999.808563, author = {J. Velasco-Medina and I. Rayane and M. Nicolaidis}, title = {On-Line BIST for Testing Analog Circuits}, journal ={Computer Design, International Conference on}, volume = {0}, year = {1999}, issn = {1063-6404}, pages = {330}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808563}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - On-Line BIST for Testing Analog Circuits SN - 1063-6404 SP EP A1 - J. Velasco-Medina, A1 - I. Rayane, A1 - M. Nicolaidis, PY - 1999 VL - 0 JA - Computer Design, International Conference on ER -

J. Velasco-Medina, TIMA/INPG

I. Rayane, TIMA/INPG

M. Nicolaidis, TIMA/INPG

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808563

In this paper, we present a new on-line BIST approach for testing analog circuits. It uses current window comparator and current-based checker circuits for processing the test response of analog parts in mixed-signal integrated circuits. On-line analog BIST capability is achieved by using high-speed current-mode circuits. A leapfrog filter has been considered as test vehicle and simulation results show the feasibility and effectiveness of the proposed BIST approach.

Citation:

J. Velasco-Medina, I. Rayane, M. Nicolaidis, "On-Line BIST for Testing Analog Circuits," iccd, pp.330, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.