An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment

I
ICCD
1999
1999 IEEE International Conference on Computer Design (ICCD'99)
Abstract - An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment

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1999 IEEE International Conference on Computer Design (ICCD'99)

Austin, Texas

October 10-October 13

ISBN: 0-7695-0406-X

	ASCII Text	x
	Hyunjin Kim, Jongchul Shin, Sungho Kang, "An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment," Computer Design, International Conference on, pp. 328, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999.

	BibTex	x
	@article{ 10.1109/ICCD.1999.808562, author = {Hyunjin Kim and Jongchul Shin and Sungho Kang}, title = {An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment}, journal ={Computer Design, International Conference on}, volume = {0}, year = {1999}, issn = {1063-6404}, pages = {328}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808562}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Computer Design, International Conference on TI - An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment SN - 1063-6404 SP EP A1 - Hyunjin Kim, A1 - Jongchul Shin, A1 - Sungho Kang, PY - 1999 VL - 0 JA - Computer Design, International Conference on ER -

Hyunjin Kim, Yonsei University

Jongchul Shin, Yonsei University

Sungho Kang, Yonsei University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808562

In this paper, an efficient BIST method for applying tests is developed without collisions of the test data in 3-state nets in a system. A new interconnect test algorithm in multiple boundary scan chains and the BIST module based on the new BIST method are presented. The new algorithm can be easily applied to the any net configurations with high flexibility.

Citation:

Hyunjin Kim, Jongchul Shin, Sungho Kang, "An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment," iccd, pp.328, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999

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