loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
1999 IEEE International Conference on Computer Design (ICCD'99)
Area, Performance, and Yield Implications of Redundancy in On-Chip Caches
Austin, Texas
October 10-October 13
ISBN: 0-7695-0406-X
Tom Thomas, Motorola Incorporated
Brian Anthony, Motorola Incorporated
To meet increasing system performance demands, microprocessor designers continue to expand the amount of cache memory integrated on the processor die. The resulting additional silicon area has the undesirable effects of reducing die yield and increasing die cost. Adding redundancy to the on-chip caches can mitigate the reduced yield but introduces additional penalties in die area and performance. This paper evaluates the area, performance, and yield impact of several different implementations of on- chip cache redundancy in the context of the next member of Motorola's G4 generation of PowerPC processors.
Index Terms:
microprocessor, microprocessor design, cache, SRAM, embedded SRAM, redundancy, yield, yield enhancement
Citation:
Tom Thomas, Brian Anthony, "Area, Performance, and Yield Implications of Redundancy in On-Chip Caches," iccd, pp.291, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999
Usage of this product signifies your acceptance of the Terms of Use.