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Eighth IEEE International Symposium on High Assurance Systems Engineering (HASE'04) Tampa, Florida March 25-March 26 ISBN: 0-7695-2094-4 Table of Contents
Dongfeng Wang, University of Texas at Dallas
Hui Ma, University of Texas at Dallas
Farokh B. Bastani, University of Texas at Dallas
I-Ling Yen, University of Texas at Dallas pp. 3-11
Josh Dehlinger, Iowa State University
Robyn R. Lutz, Iowa State University and Jet Propulsion Laboratory pp. 12-21
Iain Bate, University of York
Neil Audsley, University of York pp. 22-31
Zonghua Gu, University of Michigan
Shige Wang, University of Michigan
Sharath Kodase, University of Michigan
Kang G. Shin, University of Michigan pp. 32-41
S. C. Kothari, Iowa State University
Luke Bishop, Iowa State University
Jeremias Sauceda, Iowa State University
Gary Daugherty, Rockwell Collins pp. 45-55
Yi Liu, Georgia College and State University
Taghi Khoshgoftaar, Florida Atlantic University pp. 56-65
Arshad Jhumka, Technical University at Darmstadt
Martin Hiller, Volvo
Neeraj Suri, Technical University at Darmstadt pp. 69-78
Decentralized Workload Management for Assurance According to Heterogeneous Service Levels (Abstract)
Ivan Luque, Tokyo Institute of Technology
Xiaodong Lu, Tokyo Institute of Technology
Misato Tasaka, Tokyo Institute of Technology
Kinji Mori, Tokyo Institute of Technology
Yasushi Kuba, Hitachi, Ltd. pp. 79-88
Stefan Gossens, University of Erlangen-Nuremberg
Mario Dal Cin, University of Erlangen-Nuremberg pp. 89-96
Mark Sh. Levin, Ben-Gurion University
Mark Last, Ben-Gurion University pp. 99-108
Praveen Ikkurthy, University of South Florida
John Shahbazian, University of South Florida
Miguel A. Labrador, University of South Florida
Kenneth J. Christensen, University of South Florida pp. 109-115
Rosina Weber, Drexel University
Duanqing Wu, Drexel University pp. 116-125
How Good Is Your Blind Spot Sampling Policy? (Abstract)
Tim Menzies, West Virginia University
Justin S. Di Stefano, Galaxy Global Corporation pp. 129-138
Norman F. Schneidewind, Naval Postgraduate School pp. 139-148
Shi Zhong, Florida Atlantic University
Taghi M. Khoshgoftaar, Florida Atlantic University
Naeem Seliya, Florida Atlantic University pp. 149-155
A Method for Solving Trade-Off among Cost for Owned/Borrowed Resource and Loss of Business Chances (Abstract)
Tetsuya Masuishi, Hitachi, Ltd.
Kinji Mori, Tokyo Institute of Technology pp. 156-164
Gregory L. Wickstrom, Sandia National Laboratories
Jared Davis, University of Texas at Austin
Steven E. Morrison, Sandia National Laboratories
Steve Roach, University of Texas at El Paso
Victor L. Winter, University of Nebraska at Omaha pp. 167-177
Specification Test Coverage Adequacy Criteria = Specification Test Generation Inadequacy Criteria? (Abstract)
Mats P.E. Heimdahl, University of Minnesota
Devaraj George, University of Minnesota
Robert Weber, University of Minnesota pp. 178-186
Anneliese Andrews, Washington State University
Andrew O?Fallon, Washington State University
Tom Chen, Colorado State University pp. 187-196
Chia-Chu Chiang, University of Arkansas at Little Rock pp. 197-205
Software Reliability Estimation under Uncertainty: Generalization of the Method of Moments (Abstract)
Katerina Goševa-Popstojanova, West Virginia University
Sunil Kamavaram, West Virginia University pp. 209-218
EM Algorithm for Discrete Software Reliability Models: A Unified Parameter Estimation Method (Abstract)
Hiroyuki Okamura, Hiroshima University
Atsushi Murayama, Hiroshima University
Tadashi Dohi, Hiroshima University pp. 219-228
Jan Jürjens, Technical University at München pp. 231-240
Qingkai Ma, University of Texas at Dallas
Wei Hao, University of Texas at Dallas
I-Ling Yen, University of Texas at Dallas
Farokh Bastani, University of Texas at Dallas pp. 241-248
Taghi M Khoshgoftaar, Florida Atlantic University
Mohamed E. Abushadi, Florida Atlantic University pp. 249-258
Donald J. Berndt, University of South Florida
Alison Watkins, University of South Florida pp. 261-262
Mark Last, Ben-Gurion University of the Negev
Menahem Friedman, Nuclear Research Center — Negev pp. 263-264
Automated Detection of Injected Faults in a Differential Equation Solver Network Systems Development (PDF)
Richard C. Linger, Carnegie Mellon University
Alan R. Hevner, University of South Florida
Gwendolyn Walton, Florida Southern College
Mark G. Pleszkoch, Carnegie Mellon University pp. 265-266
Richard C. Linger, Carnegie Mellon University
Mark G. Pleszkoch, Carnegie Mellon University pp. 267-268
Thomas Barr, Quantun Technology Services Inc pp. 269-270
Andrew J. Kornecki, Embry-Riddle Aeronautical University
Kimberley Hall, Embry-Riddle Aeronautical University
Darryl Hearn, Embry-Riddle Aeronautical University
Herman Lau, Embry-Riddle Aeronautical University
Janusz Zalewski, Florida Gulf Coast University pp. 273-274
Xiaodong Lu, Tokyo Institute of Technology
Yi Zhou, Tokyo Institute of Technology
Misato Tasaka, Tokyo Institute of Technology
Ivan Luque, Tokyo Institute of Technology
Kinji Mori, Tokyo Institute of Technology
Ryuji Takanuki, Hitachi, Ltd. pp. 275-276
Pramod Gupta, QSS Inc.
Johann Schumann, RIACS/NASA Ames pp. 277-278
Dejan Desovski, West Virginia University pp. 279-280
Laura Pullum, Institute for Scienti.c Research, Inc.
Marjorie Darrah, Institute for Scienti.c Research, Inc.
Spiro T. Skias, Institute for Scienti.c Research, Inc.
Kam S. Tso, IA Tech, Inc.
Ann T. Tai, IA Tech, Inc. pp. 281-282
Seo Ryong Koo, Korea Advanced Institute of Science and Technology
Poong Hyun Seong, Korea Advanced Institute of Science and Technology
Sung Deok Cha, Korea Advanced Institute of Science and Technology pp. 283-284
Myung Jun Song, Korea Advanced Institute of Science and Technology
Seo Ryong Koo, Korea Advanced Institute of Science and Technology
Poong Hyun Seong, Korea Advanced Institute of Science and Technology pp. 285-286
Lazar Crawford, Embry Riddle Aeronautical University
Jared Erwin, Embry Riddle Aeronautical University
Steafano Grimaldi, Embry Riddle Aeronautical University
Soma Mitra, Embry Riddle Aeronautical University
Andrew Kornecki, Embry Riddle Aeronautical University
David P. Gluch, Embry Riddle Aeronautical University pp. 287-288
Huiqun Yu, Florida International University
Xudong He, Florida International University
Yi Deng, Florida International University
Lian Mo, Florida International University pp. 289-290
Frederick Sheldon, Oak Ridge National Laboratory
Tom Potok, Oak Ridge National Laboratory
Andy Loebl, Oak Ridge National Laboratory
Axel Krings, University of Idaho
Paul Oman, University of Idaho pp. 293-296
Ewen Denney, NASA Ames Research Center
Bernd Fischer, NASA Ames Research Center
Johann Schumann, NASA Ames Research Center pp. 297-299
Tom Keeley, Compsim LLC pp. 300-301
Jia Zhou, University of Texas at Dallas
Kendra Cooper, University of Texas at Dallas
I-Ling Yen, University of Texas at Dallas pp. 302-303
Hideki Nomoto, Massachusetts Institute of Technology pp. 304-305
Jing Dong, University of Texas at Dallas
Sheng Yang, University of Texas at Dallas pp. 306-307
Wei Yu, Texas A&M University pp. 308-309
Yiannis Papadopoulos, University of Hull
David Parker, University of Hull
Christian Grante, Volvo Cars Corporation pp. 310-311
Enhancing Testability in Architectural Design for the New Generation of Core-Based Embedded Systems (PDF)
Mansour H. Assaf, University of Ottawa
Sunil R. Das, University of Ottawa and Troy State University Montgomery
Emil M. Petriu, University of Ottawa
Mehmet Sahinoglu, Troy State University Montgomery pp. 312-313
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