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Eighth IEEE International Symposium on High Assurance Systems Engineering (HASE'04)
Multi-Function System Testing: Composition of Test Sets
Tampa, Florida
March 25-March 26
ISBN: 0-7695-2094-4
ASCII Text
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Mark Sh. Levin, Mark Last, "Multi-Function System Testing: Composition of Test Sets," High-Assurance Systems Engineering, IEEE International Symposium on, pp. 99-108, Eighth IEEE International Symposium on High Assurance Systems Engineering (HASE'04), 2004.
 
 
BibTex
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@article{ 10.1109/HASE.2004.1281734,
author = {Mark Sh. Levin and Mark Last},
title = {Multi-Function System Testing: Composition of Test Sets},
journal ={High-Assurance Systems Engineering, IEEE International Symposium on},
volume = {0},
year = {2004},
issn = {1530-2059},
pages = {99-108},
doi = {http://doi.ieeecomputersociety.org/10.1109/HASE.2004.1281734},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - High-Assurance Systems Engineering, IEEE International Symposium on
TI - Multi-Function System Testing: Composition of Test Sets
SN - 1530-2059
SP99
EP108
A1 - Mark Sh. Levin,
A1 - Mark Last,
PY - 2004
KW - null
VL - 0
JA - High-Assurance Systems Engineering, IEEE International Symposium on
ER -
 
Mark Sh. Levin, Ben-Gurion University
Mark Last, Ben-Gurion University
This paper focuses on the following aspects of multi-function system testing: analysis of system requirements and revelation of atomic system functions and their relationships, analysis of input/output variables, analysis of system function groups (clusters), composition of the test sets for each group of atomic system functions. Related problems associated with these aspects are briefly described. Numerical and real world examples illustrate the proposed approach.
Citation:
Mark Sh. Levin, Mark Last, "Multi-Function System Testing: Composition of Test Sets," hase, pp.99-108, Eighth IEEE International Symposium on High Assurance Systems Engineering (HASE'04), 2004
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