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Ninth Great Lakes Symposium on VLSI
Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits
Ann Arbor, Michigan
March 04-March 06
ISBN: 0-7695-0104-4
ASCII Text
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Mostafa Abd-El-Barr, Yanging Xu, Carl McCrosky, "Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits," Great Lakes Symposium on VLSI, pp. 388, Ninth Great Lakes Symposium on VLSI, 1999.
 
 
BibTex
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@article{ 10.1109/GLSV.1999.757464,
author = {Mostafa Abd-El-Barr and Yanging Xu and Carl McCrosky},
title = {Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits},
journal ={Great Lakes Symposium on VLSI},
volume = {0},
year = {1999},
issn = {1066-1395},
pages = {388},
doi = {http://doi.ieeecomputersociety.org/10.1109/GLSV.1999.757464},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Great Lakes Symposium on VLSI
TI - Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits
SN - 1066-1395
SP
EP
A1 - Mostafa Abd-El-Barr,
A1 - Yanging Xu,
A1 - Carl McCrosky,
PY - 1999
KW - Transistor stuck-open fault
KW - two-pattern test
KW - test pattern generation
KW - multi-level CMOS circuits testing
KW - robust CMOS testing.
VL - 0
JA - Great Lakes Symposium on VLSI
ER -
 
Mostafa Abd-El-Barr, King Fahd University of Petroleum & Minerals
Yanging Xu, University of Saskatchewan
Carl McCrosky, University of Saskatchewan
The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multi-level CMOS circuits are shown. A method for representing a two-pattern test for detecting a single stuck-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The application of the proposed approach in robust test generation for transistor stuck-open faults in a number of benchmark circuits is demonstrated. The fault coverage achieved is as good as or better than those reported using existing techniques.
Index Terms:
Transistor stuck-open fault, two-pattern test, test pattern generation, multi-level CMOS circuits testing, robust CMOS testing.
Citation:
Mostafa Abd-El-Barr, Yanging Xu, Carl McCrosky, "Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits," glsvlsi, pp.388, Ninth Great Lakes Symposium on VLSI, 1999
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