This paper considers the problem of testing VLSI integrated circuits without exceeding their power ratings during test. The proposed approach is based on the reordering of test vectors of a given test sequence to minimize the average and peak power dissipation during test operation. For this purpose, the proposed technique reduces the internal switching activity by lowering the transition density at circuit inputs. The technique considers combinational or full scan sequential circuits and do not modify the initial fault coverage. Results of experiments show reductions of the switching activity ranging from 11 % to 66 % during external test application.