On Test Generation with A Limited Number of Tests

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Ninth Great Lakes Symposium on VLSI

Ann Arbor, Michigan

March 04-March 06

ISBN: 0-7695-0104-4

	ASCII Text	x
	Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara, "On Test Generation with A Limited Number of Tests," Great Lakes Symposium on VLSI, pp. 12, Ninth Great Lakes Symposium on VLSI, 1999.

	BibTex	x
	@article{ 10.1109/GLSV.1999.757366, author = {Hideyuki Ichihara and Kozo Kinoshita and Seiji Kajihara}, title = {On Test Generation with A Limited Number of Tests}, journal ={Great Lakes Symposium on VLSI}, volume = {0}, year = {1999}, issn = {1066-1395}, pages = {12}, doi = {http://doi.ieeecomputersociety.org/10.1109/GLSV.1999.757366}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Great Lakes Symposium on VLSI TI - On Test Generation with A Limited Number of Tests SN - 1066-1395 SP EP A1 - Hideyuki Ichihara, A1 - Kozo Kinoshita, A1 - Seiji Kajihara, PY - 1999 VL - 0 JA - Great Lakes Symposium on VLSI ER -

Hideyuki Ichihara, Osaka University

Kozo Kinoshita, Osaka University

Seiji Kajihara, Osaka University and Kyushu Institute of Technology

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/GLSV.1999.757366

This paper considers a new test generation scheme in which a limitation of the number of tests exists. Since, in this scheme, correct fault coverage cannot be calculated by the representative faults, we present a method for calculating the correct fault coverage by using the weighted fault list. And then we propose a selection-based test generation method which derives limited number of tests with higher fault coverage. The experimental results for IDDQ testing shows that our test generation method can generate tests with fault coverage close to the maximum fault coverage.

Citation:

Hideyuki Ichihara, Kozo Kinoshita, Seiji Kajihara, "On Test Generation with A Limited Number of Tests," glsvlsi, pp.12, Ninth Great Lakes Symposium on VLSI, 1999

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