Pseudo-random behavioral ATPG

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	Similar Articles Articles by A.-L. Courbis Articles by J.-F. Santucci

Fifth Great Lakes Symposium on VLSI (GLSVLSI'95)

The State University of New York at Buffalo

March 16-March 18

ISBN: 0-8186-7035-5

	ASCII Text	x
	A.-L. Courbis, J.-F. Santucci, "Pseudo-random behavioral ATPG," Great Lakes Symposium on VLSI, pp. 192, Fifth Great Lakes Symposium on VLSI (GLSVLSI'95), 1995.

	BibTex	x
	@article{ 10.1109/GLSV.1995.516051, author = {A.-L. Courbis and J.-F. Santucci}, title = {Pseudo-random behavioral ATPG}, journal ={Great Lakes Symposium on VLSI}, volume = {0}, year = {1995}, issn = {1066-1395}, pages = {192}, doi = {http://doi.ieeecomputersociety.org/10.1109/GLSV.1995.516051}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Great Lakes Symposium on VLSI TI - Pseudo-random behavioral ATPG SN - 1066-1395 SP EP A1 - A.-L. Courbis, A1 - J.-F. Santucci, PY - 1995 KW - logic testing; automatic testing; fault diagnosis; hardware description languages; pseudo-random behavioral ATPG; VHDL VL - 0 JA - Great Lakes Symposium on VLSI ER -

A.-L. Courbis, LG12P, EMA-EERIE, Nimes, France

J.-F. Santucci, LG12P, EMA-EERIE, Nimes, France

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/GLSV.1995.516051

This paper deals with a new approach for the Automatic Test Pattern Generation (ATPG) of circuits described from a behavioral point of view in VHDL. This approach is based on a pseudo-random process characterized by the fact that criteria for computing the test length and evaluating the quality of the generated data come from the field of software engineering. This paper presents the bases of this new approach in the field of hardware engineering and some experimental results.

Index Terms:

logic testing; automatic testing; fault diagnosis; hardware description languages; pseudo-random behavioral ATPG; VHDL

Citation:

A.-L. Courbis, J.-F. Santucci, "Pseudo-random behavioral ATPG," glsvlsi, pp.192, Fifth Great Lakes Symposium on VLSI (GLSVLSI'95), 1995

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