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25th Euromicro Conference (EUROMICRO '99)-Volume 1
A Method for Accelerating Test Environments
Milan, Italy
September 08-September 10
ISBN: 0-7695-0321-7
Matthias Bauer, Infineon Technologies
Wolfgang Ecker, Infineon Technologies
Renate Henftling, Infineon Technologies
Andreas Zinn, Infineon Technologies
Functional test environments become more and more important for the design of complex applications and systems. A lot of approaches show the integration of Hardware/Software Cosimulation in those environments.Another focus is the reuse of parts of a testbench for future use. We present a method for accelerating a test environment. Beginning with an existing testbench we explain the distribution of the behavioral functionality, which further remains on the simulator, and those parts which can be hardware accelerated. The acceleratable parts have to be detected in the testbench description and must be remodeled in a register-transfer level description. Comparisons between simulators and accelerators are stated to show the efficiency of our approach.
Citation:
Matthias Bauer, Wolfgang Ecker, Renate Henftling, Andreas Zinn, "A Method for Accelerating Test Environments," euromicro, vol. 1, pp.1477, 25th Euromicro Conference (EUROMICRO '99)-Volume 1, 1999
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