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23rd EUROMICRO Conference '97 New Frontiers of Information Technology
Array partitioning to achieve defect tolerance
Budapest, HUNGARY
September 01-September 04
ISBN: 0-8186-8129-2
F. Distante, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
M.G. Sami, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
R. Stefanelli, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
Tolerance to faults in processing arrays can be achieved-even for run time faults-by means of reconfiguration techniques that exploit architectural regularity to achieve high probability of survival with reduced redundancy and satisfying constraints on path length and interconnection channel width. These two last factors in fact limit reconfiguration efficiency, by imposing constraints on number and organization of spare elements. A partitioning approach is presented that allows us to overcome such limitations leading to high probability of survival even in the presence of "critical" fault patterns.
Index Terms:
reconfigurable architectures; array partitioning; defect tolerance; fault tolerance; processing arrays; run time faults; reconfiguration techniques; architectural regularity; survival; redundancy; path length; interconnection channel width; reconfiguration efficiency; partitioning approach; critical fault patterns
Citation:
F. Distante, M.G. Sami, R. Stefanelli, "Array partitioning to achieve defect tolerance," euromicro, pp.487, 23rd EUROMICRO Conference '97 New Frontiers of Information Technology, 1997
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