Pseudorandom versus Deterministic Testing of Intel 80x86 Processors

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by J. Sosnowski Articles by A. Kusmierczyk

Proceedings of the 22nd EUROMICRO Conference

Prague, Czech Republic

September 02-September 05

ISBN: 0-8186-7487-3

	ASCII Text	x
	J. Sosnowski, A. Kusmierczyk, "Pseudorandom versus Deterministic Testing of Intel 80x86 Processors," EUROMICRO Conference, pp. 0329, Proceedings of the 22nd EUROMICRO Conference, 1996.

	BibTex	x
	@article{ 10.1109/EURMIC.1996.546398, author = {J. Sosnowski and A. Kusmierczyk}, title = {Pseudorandom versus Deterministic Testing of Intel 80x86 Processors}, journal ={EUROMICRO Conference}, volume = {0}, year = {1996}, isbn = {0-8186-7487-3}, pages = {0329}, doi = {http://doi.ieeecomputersociety.org/10.1109/EURMIC.1996.546398}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - EUROMICRO Conference TI - Pseudorandom versus Deterministic Testing of Intel 80x86 Processors SN - 0-8186-7487-3 SP EP A1 - J. Sosnowski, A1 - A. Kusmierczyk, PY - 1996 KW - computer testing; deterministic testing; pseudorandom testing; Intel 80/spl times/86 processors; microprocessor testing VL - 0 JA - EUROMICRO Conference ER -

J. Sosnowski, Inst. of Comput. Sci., Warsaw Univ. of Technol., Poland

A. Kusmierczyk, Inst. of Comput. Sci., Warsaw Univ. of Technol., Poland

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/EURMIC.1996.546398

Abstract: The paper deals with the problem of testing microprocessors in the system environment. We discuss two approaches to testing microprocessors: deterministic and pseudorandom. They are related to Intel 80/spl times/86 processors. Many drawbacks of the deterministic approach can be overcome with pseudorandom tests. However developing pseudorandom test programs we face some other problems. The paper shows how to combine the two approaches.

Index Terms:

computer testing; deterministic testing; pseudorandom testing; Intel 80/spl times/86 processors; microprocessor testing

Citation:

J. Sosnowski, A. Kusmierczyk, "Pseudorandom versus Deterministic Testing of Intel 80x86 Processors," euromicro, pp.0329, Proceedings of the 22nd EUROMICRO Conference, 1996

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.