2007 IEEE International Conference on Exploring Quantifiable IT Yields Amsterdam, The Netherlands March 19-March 21 ISBN: 978-1-4244-2537-2 Table of Contents
pp. 9-26 pp. 27-38 pp. 45-54 pp. 55-62 pp. 73-78 pp. 79-86 pp. 87-94 pp. 95-100
Measuring the business value of availability (Abstract)
pp. 101-112
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