2003 NASA/DoD Conference on Evolvable Hardware (EH'03)
Evolution of Combinatonial and Sequential On-Line Self-Diagnosing Hardware
Chicago, Illinois
July 09-July 11
ISBN: 0-7695-1977-6
The evolution of circuits with on-line built-in self-test is attempted in simulation for a full adder, a two bit multiplier and an edge triggered D-Latch. Results show that evolved designs perform full diagnosis using less or equal number of components than hand-designed equivalents.