2003 NASA/DoD Conference on Evolvable Hardware (EH'03) Evolution of Combinatonial and Sequential On-Line Self-Diagnosing Hardware Chicago, Illinois July 09-July 11 ISBN: 0-7695-1977-6
The evolution of circuits with on-line built-in self-test is attempted in simulation for a full adder, a two bit multiplier and an edge triggered D-Latch. Results show that evolved designs perform full diagnosis using less or equal number of components than hand-designed equivalents.
Citation:
Miguel Garvie, Adrian Thompson, "Evolution of Combinatonial and Sequential On-Line Self-Diagnosing Hardware," eh, pp.177, 2003 NASA/DoD Conference on Evolvable Hardware (EH'03), 2003 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||