loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
The Second NASA/DoD Workshop on Evolvable Hardware (EH'00)
The Test Vector Problem and Limitations to Evolving Digital Circuits
Palo Alto, California
July 13-July 15
ISBN: 0-7695-0762-X
Kosuke Imamura, University of Idaho
James A. Foster, University of Idaho
Axel W. Krings, University of Idaho
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digital circuit by conventional evolutionary techniques alone, if we are using a subset of the entire truth table for fitness evaluation. The test vector generation problem for testing VLSI (Very Large Scale Integration) suggests that there is no efficient way to determine training set, which assures full correctness of an evolved circuit.
Citation:
Kosuke Imamura, James A. Foster, Axel W. Krings, "The Test Vector Problem and Limitations to Evolving Digital Circuits," eh, pp.75, The Second NASA/DoD Workshop on Evolvable Hardware (EH'00), 2000
Usage of this product signifies your acceptance of the Terms of Use.