At-Speed Functional Verification of Programmable Devices

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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04)

Cannes, France

October 10-October 13

ISBN: 0-7695-2241-6

	ASCII Text	x
	Nicola Bombieri, Franco Fummi, Graziano Pravadelli, "At-Speed Functional Verification of Programmable Devices," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 386-394, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004.

	BibTex	x
	@article{ 10.1109/DFT.2004.13, author = {Nicola Bombieri and Franco Fummi and Graziano Pravadelli}, title = {At-Speed Functional Verification of Programmable Devices}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2004}, issn = {1550-5774}, pages = {386-394}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2004.13}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - At-Speed Functional Verification of Programmable Devices SN - 1550-5774 SP386 EP394 A1 - Nicola Bombieri, A1 - Franco Fummi, A1 - Graziano Pravadelli, PY - 2004 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Nicola Bombieri, Universit? di Verona

Franco Fummi, Universit? di Verona

Graziano Pravadelli, Universit? di Verona

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFT.2004.13

In this paper we present a novel approach for functional verification of programmable devices. The proposed methodology is suited to refine the results obtained by a functional Automatic Test Pattern Generator (ATPG). The hard-to-detect faults are examined by exploiting the controllability ability of a high-level ATPG in conjunction with the observability potentiality of software instructions targeted to the programmable device. Generated test programs can be used for both functional verification and at-speed testing.

Citation:

Nicola Bombieri, Franco Fummi, Graziano Pravadelli, "At-Speed Functional Verification of Programmable Devices," dft, pp.386-394, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004

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