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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04)
Learning Based on Fault Injection and Weight Restriction for Fault-Tolerant Hopfield Neural Networks
Cannes, France
October 10-October 13
ISBN: 0-7695-2241-6
Naotake Kamiura, University of Hyogo, Japan
Teijiro Isokawa, University of Hyogo, Japan
Nobuyuki Matsui, University of Hyogo, Japan
Hopfield neural networks tolerating weight faults are presented. The weight restriction and fault injection are adopted as fault-tolerant approaches. For the weight restriction, a range to which values of weights should belong is determined during the learning, and any weight being outside this range is forced to be either its upper limit or lower limit. A status of a fault occurring is then evoked by the fault injection, and calculating weights is made under this status. The learning based on both of the above approaches surpasses the learning based on either of them in the fault tolerance and/or in the learning time.
Citation:
Naotake Kamiura, Teijiro Isokawa, Nobuyuki Matsui, "Learning Based on Fault Injection and Weight Restriction for Fault-Tolerant Hopfield Neural Networks," dft, pp.339-346, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004
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