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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04)
Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method
Cannes, France
October 10-October 13
ISBN: 0-7695-2241-6
ASCII Text
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Yukiya Miura, "Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 230-238, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004.
 
 
BibTex
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@article{ 10.1109/DFT.2004.31,
author = {Yukiya Miura},
title = {Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2004},
issn = {1550-5774},
pages = {230-238},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2004.31},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method
SN - 1550-5774
SP230
EP238
A1 - Yukiya Miura,
PY - 2004
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Yukiya Miura, Tokyo Metropolitan University
An X-Y zoning method can detect faults of analog circuits by using the relationship between circuit inputs and outputs. An operation-region model can analyze/model circuit behaviors by observing changes in the operation regions of MOS transistors in a circuit. In this paper, we propose a method for diagnosing analog circuits by combining the OR model and the X-Y zoning method. A diagnosis procedure is realized by the similar way to the method for digital circuits. In order to demonstrate the effectiveness of the proposed method, we apply the method to ITC'97 benchmark circuits with hard faults and soft faults. We obtained the result that the diagnostic resolution is one for every fault.
Citation:
Yukiya Miura, "Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method," dft, pp.230-238, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004
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