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19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04)
Mixed Loopback BiST for RF Digital Transceivers
Cannes, France
October 10-October 13
ISBN: 0-7695-2241-6
ASCII Text
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Jerzy Dabrowski, Javier Gonzalez Bayon, "Mixed Loopback BiST for RF Digital Transceivers," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 220-228, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004.
 
 
BibTex
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@article{ 10.1109/DFT.2004.37,
author = {Jerzy Dabrowski and Javier Gonzalez Bayon},
title = {Mixed Loopback BiST for RF Digital Transceivers},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2004},
issn = {1550-5774},
pages = {220-228},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFT.2004.37},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Mixed Loopback BiST for RF Digital Transceivers
SN - 1550-5774
SP220
EP228
A1 - Jerzy Dabrowski,
A1 - Javier Gonzalez Bayon,
PY - 2004
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
Jerzy Dabrowski, Link?ping University, Sweden
Javier Gonzalez Bayon, Link?ping University, Sweden
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generator and response analyzer. The test is oriented at spot defects in a transceiver front-end. Estimates for noise, signal power and nonlinear distortions such as EVM (or SER), gain and IP3, respectively, are considered the test responses. Limitations of these tests are investigated with respect to the test path properties, the strength of defects and circuit tolerances. The IP3 test complements the EVM (SER) and gain tests for some spot defects. The analysis is verified by simulation of a functional-level RF transceiver model implemented in Matlab™.
Citation:
Jerzy Dabrowski, Javier Gonzalez Bayon, "Mixed Loopback BiST for RF Digital Transceivers," dft, pp.220-228, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'04), 2004
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