SIED: Software Implemented Error Detection

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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)

Boston, Massachusetts

November 03-November 05

ISBN: 0-7695-2042-1

	ASCII Text	x
	B. Nicolescu, Y. Savaria, R. Velazco, "SIED: Software Implemented Error Detection," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 589, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.

	BibTex	x
	@article{ 10.1109/DFTVS.2003.1250159, author = {B. Nicolescu and Y. Savaria and R. Velazco}, title = {SIED: Software Implemented Error Detection}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2003}, issn = {1063-6722}, pages = {589}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250159}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - SIED: Software Implemented Error Detection SN - 1063-6722 SP EP A1 - B. Nicolescu, A1 - Y. Savaria, A1 - R. Velazco, PY - 2003 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

B. Nicolescu, Ecole Polytechnique de Montr?al

Y. Savaria, Ecole Polytechnique de Montr?al

R. Velazco, TIMA Laboratory

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250159

This paper presents a new error detection technique called Software Implemented Error Detection (SIED). The proposed method is based on a new control check flow scheme combined with software redundancy. The distinctive advantage of the SIED approach over other fault tolerance techniques is the fault coverage. SIED is able to cope with faults affecting data and the program control flow. By applying the proposed approach on several benchmark programs, we evaluate the error detection capabilities by means of several fault injection experiments. Experimental results underline very good error detection capabilities for the obtained hardened version of selected benchmark programs.

Citation:

B. Nicolescu, Y. Savaria, R. Velazco, "SIED: Software Implemented Error Detection," dft, pp.589, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003

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