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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
Preliminary Validation of an Approach Dealing with Processor Obsolescence
Boston, Massachusetts
November 03-November 05
ISBN: 0-7695-2042-1
ASCII Text
x 
 
L. Anghel, R. Velazco, S. Saleh, S. Deswaertes, A. El Moucary, "Preliminary Validation of an Approach Dealing with Processor Obsolescence," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 493, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.
 
 
BibTex
x
 
@article{ 10.1109/DFTVS.2003.1250148,
author = {L. Anghel and R. Velazco and S. Saleh and S. Deswaertes and A. El Moucary},
title = {Preliminary Validation of an Approach Dealing with Processor Obsolescence},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2003},
issn = {1063-6722},
pages = {493},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250148},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Preliminary Validation of an Approach Dealing with Processor Obsolescence
SN - 1063-6722
SP
EP
A1 - L. Anghel,
A1 - R. Velazco,
A1 - S. Saleh,
A1 - S. Deswaertes,
A1 - A. El Moucary,
PY - 2003
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
L. Anghel, TIMA Laboratory
R. Velazco, TIMA Laboratory
S. Saleh, TIMA Laboratory
S. Deswaertes, TIMA Laboratory
A. El Moucary, TIMA Laboratory

Processor obsolescence is a big concern affecting most equipments involved in safety critical applications (automotive, aerospace, nuclear plants, military applications …). Indeed, such applications are active years longer than was originally anticipated.

A method for validating the solution consisting in the replacement of a processor not anymore available into the market by its emulated version by means of an FPGA is presented in this paper.

The Motorola 6800 processor is used as test vehicle to illustrate the key aspects of the explored validation plan. Significant experimental results and their impact on the HDL description will be discussed.

Citation:
L. Anghel, R. Velazco, S. Saleh, S. Deswaertes, A. El Moucary, "Preliminary Validation of an Approach Dealing with Processor Obsolescence," dft, pp.493, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003
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