Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator

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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)

Boston, Massachusetts

November 03-November 05

ISBN: 0-7695-2042-1

	ASCII Text	x
	Rob Aitken, Neeraj Dogra, Dhrumil Gandhi, Scott Becker, "Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 467, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.

	BibTex	x
	@article{ 10.1109/DFTVS.2003.1250145, author = {Rob Aitken and Neeraj Dogra and Dhrumil Gandhi and Scott Becker}, title = {Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2003}, issn = {1063-6722}, pages = {467}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250145}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator SN - 1063-6722 SP EP A1 - Rob Aitken, A1 - Neeraj Dogra, A1 - Dhrumil Gandhi, A1 - Scott Becker, PY - 2003 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Rob Aitken, Artisan Components

Neeraj Dogra, Artisan Components

Dhrumil Gandhi, Artisan Components

Scott Becker, Artisan Components

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250145

Today?s System on Chip (SoC) designs can use hundreds of embedded memories. Most of these are created by automated generators, which must produce a wide variety of configurations while retaining essential capabilities in area, performance, power and testability. Redundancy, repair, and test issues in the context of memory generators are more complex than they are in the context of individual embedded memories, or even internally developed memories.

Citation:

Rob Aitken, Neeraj Dogra, Dhrumil Gandhi, Scott Becker, "Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator," dft, pp.467, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003

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