18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03) An FFT Approximation Technique Suitable for On-Chip Generation and Analysis of Sinusoidal Signals Boston, Massachusetts November 03-November 05 ISBN: 0-7695-2042-1
Signal generation and analysis are an important part of BIST for analog and mixed-signal systems. An accurate analysis of the spectral content of signals produced by analog components can be accomplished with a digital implementation of a fast Fourier transform (FFT) algorithm. In the past, size and speed have limited the application of such a technique to o.-chip test equipment or DSP chips (primarily due to the number of multiplication operations). In this paper, we present an FFT approximation technique suitable for on-chip spectral BIST signal generation and analysis. For signal generation, we show that the noise produced by the approximation technique is under 24.74 dB for a 256 point FFT with a 32 point approximate kernel. For signal analysis, we show that the instantaneous dynamic range (IDR) for the approximation technique is under 21.80 dB for a 256 point FFT with a 32 point approximate kernel. Our techniques have been implemented and demonstrated on a Xilinx Virtex-II FPGA using an o.-chip ADC and DAC, and we are currently implementing the technique on an ASIC using a 0.13?m SiGe process for 2-16GHz applications 1.
Citation:
John M. Emmert, Jason A. Cheatham, Badhri Jagannathan, Sandeep Umarani, "An FFT Approximation Technique Suitable for On-Chip Generation and Analysis of Sinusoidal Signals," dft, pp.361, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||