loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
Low Cost Convolutional Code Based Concurrent Error Detection in FSMs
Boston, Massachusetts
November 03-November 05
ISBN: 0-7695-2042-1
Konstantinos Rokas, Yale University
Yiorgos Makris, Yale University
Dimitris Gizopoulos, University of Piraeus
We discuss the use of convolutional codes to perform concurrent error detection (CED) in finite state machines (FSMs). We examine a previously proposed methodology, we identify its limitations, and we outline two improvements that reduce its cost and enhance its effectiveness. More specifically, we demonstrate how the existing FSM hardware can be reused for computing the convolutional code keys and we formulate the optimization problem of maximizing hardware reusability. Additionally, we extend the proposed methodology to detect errors that only affect the output logic but not the next state of the FSM, which are not detected by the previously proposed methodology.
Citation:
Konstantinos Rokas, Yiorgos Makris, Dimitris Gizopoulos, "Low Cost Convolutional Code Based Concurrent Error Detection in FSMs," dft, pp.344, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003
Usage of this product signifies your acceptance of the Terms of Use.