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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
Function-Based Dynamic Compaction and its Impact on Test Set Sizes
Boston, Massachusetts
November 03-November 05
ISBN: 0-7695-2042-1
ASCII Text
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James Wingfield, Jennifer Dworak, M. Ray Mercer, "Function-Based Dynamic Compaction and its Impact on Test Set Sizes," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 167, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.
 
 
BibTex
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@article{ 10.1109/DFTVS.2003.1250109,
author = {James Wingfield and Jennifer Dworak and M. Ray Mercer},
title = {Function-Based Dynamic Compaction and its Impact on Test Set Sizes},
journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on},
volume = {0},
year = {2003},
issn = {1063-6722},
pages = {167},
doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250109},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
TI - Function-Based Dynamic Compaction and its Impact on Test Set Sizes
SN - 1063-6722
SP
EP
A1 - James Wingfield,
A1 - Jennifer Dworak,
A1 - M. Ray Mercer,
PY - 2003
KW - null
VL - 0
JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on
ER -
 
James Wingfield, Texas A&M University
Jennifer Dworak, Texas A&M University
M. Ray Mercer, Texas A&M University
Due to the limited amount of available resources and time used for manufacture testing of integrated circuits, there is great interest in minimizing the number of test patterns applied while maintaining a large number of defect detections. Many methods have been developed to generate compact test pattern sets, and this paper extends the concepts of one such method (pattern-based dynamic compaction) into the functional realm. We will show that function-based dynamic compaction yields very compact test sets, and it retains compact performance for fault models of different difficulty.
Citation:
James Wingfield, Jennifer Dworak, M. Ray Mercer, "Function-Based Dynamic Compaction and its Impact on Test Set Sizes," dft, pp.167, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003
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