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18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment
Boston, Massachusetts
November 03-November 05
ISBN: 0-7695-2042-1
Fengming Zhang, Northeastern University
Y.J. Lee, Northeastern University
T. Kane, LTX Corporation
L. Schiano, Northeastern University
M. Momenzadeh, Northeastern University
Y-B Kim, Northeastern University
F.J. Meyer, Northeastern University
F. Lombardi, Northeastern University
S. Max, LTX Corporation
Phil Perkinson, LTX Corporation

Recent research on modeling timing jitter has raised a requirement for a predictable, high magnitude, uniform, and wide bandwidth H-field. In this paper, a novel H-field generator design methodology is proposed. It consists of a single layer air core solenoid and a digital power switch driver that takes advantage of low power, wide bandwidth, and big current-driven capability. With input overdrive voltage, the digital switch can drive rail-to-rail voltage with output current up to 16A and power bandwidth more than 3 MHz.

This paper demonstrates a novel solenoid driver circuit to generate an accurate H-field by comparing digital and analog approaches and comparing the experimental data with the theoretical data.

Citation:
Fengming Zhang, Y.J. Lee, T. Kane, L. Schiano, M. Momenzadeh, Y-B Kim, F.J. Meyer, F. Lombardi, S. Max, Phil Perkinson, "A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment," dft, pp.159, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003
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