	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Hiroshi Takahashi Articles by Yasunori Tsugaoka Articles by Hidekazu Ayano Articles by Yuzo Takamatsu

18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)

BIST Based Fault Diagnosis Using Ambiguous Test Set

Boston, Massachusetts

November 03-November 05

ISBN: 0-7695-2042-1

	ASCII Text	x
	Hiroshi Takahashi, Yasunori Tsugaoka, Hidekazu Ayano, Yuzo Takamatsu, "BIST Based Fault Diagnosis Using Ambiguous Test Set," Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on, pp. 89, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003.

	BibTex	x
	@article{ 10.1109/DFTVS.2003.1250099, author = {Hiroshi Takahashi and Yasunori Tsugaoka and Hidekazu Ayano and Yuzo Takamatsu}, title = {BIST Based Fault Diagnosis Using Ambiguous Test Set}, journal ={Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on}, volume = {0}, year = {2003}, issn = {1063-6722}, pages = {89}, doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250099}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on TI - BIST Based Fault Diagnosis Using Ambiguous Test Set SN - 1063-6722 SP EP A1 - Hiroshi Takahashi, A1 - Yasunori Tsugaoka, A1 - Hidekazu Ayano, A1 - Yuzo Takamatsu, PY - 2003 KW - null VL - 0 JA - Defect and Fault-Tolerance in VLSI Systems, IEEE International Symposium on ER -

Hiroshi Takahashi, Ehime University

Yasunori Tsugaoka, Ehime University

Hidekazu Ayano, Ehime University

Yuzo Takamatsu, Ehime University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250099

We propose a method for diagnosing single stuck-at faults under Built-In Self-Test (BIST) environment. Under BIST environment, it is di.cult to determine which BIST vectors produced errors due to the high degree of test response compaction. Therefore the detecting test set that is determined in BIST session includes un-detecting tests. We call the detecting test set determined after BIST session an "ambiguous diagnostic test set". First, we propose a method for identifying candidate faults based on the ambiguous diagnostic test set. Moreover we propose a method for identifying candidate un-detecting tests that belong to the ambiguous diagnostic test set. Diagnosis by using more accurate diagnostic test set is able to improve the diagnostic ambiguity.

Citation:

Hiroshi Takahashi, Yasunori Tsugaoka, Hidekazu Ayano, Yuzo Takamatsu, "BIST Based Fault Diagnosis Using Ambiguous Test Set," dft, pp.89, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.