An Overview of the Open Architecture Test System

D
DELTA
2004
Second IEEE International Workshop on Electronic Design, Test and Applications
Abstract - An Overview of the Open Architecture Test System

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Second IEEE International Workshop on Electronic Design, Test and Applications

Perth, Australia

January 28-January 30

ISBN: 0-7695-2081-2

	ASCII Text	x
	Rochit Rajsuman, "An Overview of the Open Architecture Test System," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 341, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004.

	BibTex	x
	@article{ 10.1109/DELTA.2004.10026, author = {Rochit Rajsuman}, title = {An Overview of the Open Architecture Test System}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2004}, isbn = {0-7695-2081-2}, pages = {341}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10026}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - An Overview of the Open Architecture Test System SN - 0-7695-2081-2 SP EP A1 - Rochit Rajsuman, PY - 2004 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Rochit Rajsuman, Advantest America R&D Center

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10026

An open architecture test system has been envisioned to address the re-usability of the test solutions. The open architecture provides a method and framework under which software and test instruments of different vendors can be developed and integrated into an Automatic Test Equipment (ATE). The framework uses standard interfaces so that each modular unit (software or hardware) can be replaced with another modular unit from a different vendor. The basic structure of the Open Architecture Test System is described in this paper.

Citation:

Rochit Rajsuman, "An Overview of the Open Architecture Test System," delta, pp.341, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004

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