Second IEEE International Workshop on Electronic Design, Test and Applications
Design of CMOS IO Drivers with Less Sensitivity to Process, Voltage, and Temperature Variations
Perth, Australia
January 28-January 30
ISBN: 0-7695-2081-2
Matching I/O driver output resistance to transmission line impedance is critical for high speed I/O operation in source series termination environments. Tuning driver output resistance can be accomplished through the use of calibration circuitry. Under ideal conditions, calibration circuitry can properly calibrate an I/O driver. Operating in an environment with die process, voltage and temperature variations, that same calibration circuitry may perform improperly. This paper presents an I/O driver design that is less sensitive to process, voltage and temperature variations. The proposed driver design provides a near linear, or flat, output resistance response verses output voltageMatching I/O driver output resistance to transmission line impedance is critical for high speed I/O operation in source series termination environments. Tuning driver output resistance can be accomplished through the use of calibration circuitry. Under ideal conditions, calibration circuitry can properly calibrate an I/O driver. Operating in an environment with die process, voltage and temperature variations, that same calibration circuitry may perform improperly. This paper presents an I/O driver design that is less sensitive to process, voltage and temperature variations. The proposed driver design provides a near linear, or flat, output resistance response verses output voltage
Citation:
Gerald Esch Jr., Tom Chen, "Design of CMOS IO Drivers with Less Sensitivity to Process, Voltage, and Temperature Variations," delta, pp.312, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb