Microsystem Development Using the TQM Design Methodology

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Second IEEE International Workshop on Electronic Design, Test and Applications

Perth, Australia

January 28-January 30

ISBN: 0-7695-2081-2

	ASCII Text	x
	Andrzej Rucinski, Artur Skrygulec, Khrystyna Pysareva, Jakub Mocny, "Microsystem Development Using the TQM Design Methodology," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 225, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004.

	BibTex	x
	@article{ 10.1109/DELTA.2004.10056, author = {Andrzej Rucinski and Artur Skrygulec and Khrystyna Pysareva and Jakub Mocny}, title = {Microsystem Development Using the TQM Design Methodology}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2004}, isbn = {0-7695-2081-2}, pages = {225}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10056}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Microsystem Development Using the TQM Design Methodology SN - 0-7695-2081-2 SP EP A1 - Andrzej Rucinski, A1 - Artur Skrygulec, A1 - Khrystyna Pysareva, A1 - Jakub Mocny, PY - 2004 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Andrzej Rucinski, University of New Hampshire, Durham

Artur Skrygulec, University of New Hampshire, Durham

Khrystyna Pysareva, University of New Hampshire, Durham

Jakub Mocny, University of New Hampshire, Durham

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10056

Equilibrium between technology for microelectronic systems and their theory is constantly sought. However, it appears that technology advances are ahead of their underlying theory. The paper describes formalism for the development of microelectronic systems, called microsystems², to include mechanical and optoelectronic components that restore the necessary balance. Using this formalism, we introduce a TQM design methodology to emphasize the importance of integrated design, test, and reliability. The methodology is illustrated using a microsystem developed for biometrics applications.

Citation:

Andrzej Rucinski, Artur Skrygulec, Khrystyna Pysareva, Jakub Mocny, "Microsystem Development Using the TQM Design Methodology," delta, pp.225, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004

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