Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing

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Second IEEE International Workshop on Electronic Design, Test and Applications

Perth, Australia

January 28-January 30

ISBN: 0-7695-2081-2

	ASCII Text	x
	Scott Thomas, Rafic Makki, Sai Kishore Vavilala, "Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 195, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004.

	BibTex	x
	@article{ 10.1109/DELTA.2004.10031, author = {Scott Thomas and Rafic Makki and Sai Kishore Vavilala}, title = {Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2004}, isbn = {0-7695-2081-2}, pages = {195}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10031}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing SN - 0-7695-2081-2 SP EP A1 - Scott Thomas, A1 - Rafic Makki, A1 - Sai Kishore Vavilala, PY - 2004 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Scott Thomas, University of North Carolina at Charlotte

Rafic Makki, College of IT, UAE University

Sai Kishore Vavilala, University of North Carolina at Charlotte

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10031

We present an iDDT fault analysis study based on physical measurements of circuits with built-in defects. A variety of defects were inserted into basic circuit components. The measured results were utilized to better model the effect of defects on iDDT and improve simulated fault models.

Citation:

Scott Thomas, Rafic Makki, Sai Kishore Vavilala, "Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing," delta, pp.195, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004

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