CMOS Open Fault Detection by Appearance Time of Switching Supply Current

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Second IEEE International Workshop on Electronic Design, Test and Applications

Perth, Australia

January 28-January 30

ISBN: 0-7695-2081-2

	ASCII Text	x
	Masaki Hashizume, Tetsuo Akita, Hiroyuki Yotsuyanagi, Takeomi Tamesada, "CMOS Open Fault Detection by Appearance Time of Switching Supply Current," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 183, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004.

	BibTex	x
	@article{ 10.1109/DELTA.2004.10036, author = {Masaki Hashizume and Tetsuo Akita and Hiroyuki Yotsuyanagi and Takeomi Tamesada}, title = {CMOS Open Fault Detection by Appearance Time of Switching Supply Current}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2004}, isbn = {0-7695-2081-2}, pages = {183}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10036}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - CMOS Open Fault Detection by Appearance Time of Switching Supply Current SN - 0-7695-2081-2 SP EP A1 - Masaki Hashizume, A1 - Tetsuo Akita, A1 - Hiroyuki Yotsuyanagi, A1 - Takeomi Tamesada, PY - 2004 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Masaki Hashizume, The Univ. of Tokushima

Tetsuo Akita, The Univ. of Tokushima

Hiroyuki Yotsuyanagi, The Univ. of Tokushima

Takeomi Tamesada, The Univ. of Tokushima

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10036

In this paper, a new dynamic supply current test method is proposed for detecting open defects on signal lines in CMOS logic circuits. The method is based on the appearance time of dynamic supply current that flows when a test input vector is provided to a circuit under test. Also, we introduce our designed sensor circuit of the appearance time. Feasibility of tests based on the test method is examined by some experiments. The experimental results show that open defects on signal lines in CMOS logic circuits will be detected by the test method.

Citation:

Masaki Hashizume, Tetsuo Akita, Hiroyuki Yotsuyanagi, Takeomi Tamesada, "CMOS Open Fault Detection by Appearance Time of Switching Supply Current," delta, pp.183, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004

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