Hybrid BIST Optimization for Core-based Systems with Test Pattern Broadcasting

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	Similar Articles Articles by Raimund Ubar Articles by Maksim Jenihhin

Second IEEE International Workshop on Electronic Design, Test and Applications

Perth, Australia

January 28-January 30

ISBN: 0-7695-2081-2

	ASCII Text	x
	Raimund Ubar, Maksim Jenihhin, "Hybrid BIST Optimization for Core-based Systems with Test Pattern Broadcasting," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 3, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004.

	BibTex	x
	@article{ 10.1109/DELTA.2004.10057, author = {Raimund Ubar and Maksim Jenihhin}, title = {Hybrid BIST Optimization for Core-based Systems with Test Pattern Broadcasting}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2004}, isbn = {0-7695-2081-2}, pages = {3}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10057}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Hybrid BIST Optimization for Core-based Systems with Test Pattern Broadcasting SN - 0-7695-2081-2 SP EP A1 - Raimund Ubar, A1 - Maksim Jenihhin, PY - 2004 KW - null VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Raimund Ubar, Tallinn Technical University, Estonia

Maksim Jenihhin, Tallinn Technical University, Estonia

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10057

This paper introduces a technique for hybrid BIST time optimization for testing core-based systems that use test pattern broadcasting for both pseudorandom and deterministic patterns. First we formulate the test time minimization problem for such an architecture. Thereafter we present algorithms for finding an efficient combination of pseudorandom and deterministic test sets under given memory constraints, so that the system testing time can be shortened. We also analyze the significance of the pseudorandom sequence quality for the final results. The results are illustrated and the efficiency of the approach is demonstrated by experimental results.

Citation:

Raimund Ubar, Maksim Jenihhin, "Hybrid BIST Optimization for Core-based Systems with Test Pattern Broadcasting," delta, pp.3, Second IEEE International Workshop on Electronic Design, Test and Applications, 2004

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