Test Bed for Number Plate Recognition Applications

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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)

Christchurch, New Zealand

January 29-January 31

ISBN: 0-7695-1453-7

	ASCII Text	x
	D.G. Bailey, D. Irecki, B.K. Lim, L. Yang, "Test Bed for Number Plate Recognition Applications," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 501, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.

	BibTex	x
	@article{ 10.1109/DELTA.2002.994684, author = {D.G. Bailey and D. Irecki and B.K. Lim and L. Yang}, title = {Test Bed for Number Plate Recognition Applications}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2002}, isbn = {0-7695-1453-7}, pages = {501}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994684}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Test Bed for Number Plate Recognition Applications SN - 0-7695-1453-7 SP EP A1 - D.G. Bailey, A1 - D. Irecki, A1 - B.K. Lim, A1 - L. Yang, PY - 2002 VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

D.G. Bailey, Massey University

D. Irecki, Massey University

B.K. Lim, Singapore Polytechnic

L. Yang, Singapore Polytechnic

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994684

A flexible software based platform for number plate recognitions applications is described. It breaks the processing into several explicit modules, with the implementation for each module provided by a software plugin using a DLL interface. The modular structure greatly facilitates the comparison between different algorithms for a particular step, and allows code to be reused between applications.

Citation:

D.G. Bailey, D. Irecki, B.K. Lim, L. Yang, "Test Bed for Number Plate Recognition Applications," delta, pp.501, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002

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