Test Chirp Signal Generation Using Spectral Warping

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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)

Christchurch, New Zealand

January 29-January 31

ISBN: 0-7695-1453-7

	ASCII Text	x
	W. Allen, D. Bailey, S. Demidenko, V. Piuri, "Test Chirp Signal Generation Using Spectral Warping," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 492, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.

	BibTex	x
	@article{ 10.1109/DELTA.2002.994682, author = {W. Allen and D. Bailey and S. Demidenko and V. Piuri}, title = {Test Chirp Signal Generation Using Spectral Warping}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2002}, isbn = {0-7695-1453-7}, pages = {492}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994682}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Test Chirp Signal Generation Using Spectral Warping SN - 0-7695-1453-7 SP EP A1 - W. Allen, A1 - D. Bailey, A1 - S. Demidenko, A1 - V. Piuri, PY - 2002 KW - Electronic testing KW - DSP KW - spectral warping KW - chirp signal generation VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

W. Allen, Massey University

D. Bailey, Massey University

S. Demidenko, Massey University

V. Piuri, University of Milan

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994682

A DSP technique that transforms a digital signal by warping the frequency axis is discussed. The technique corresponds to a mapping of the samples in the z-domain such that they are unevenly spaced around the unit circle. A spectral warping network has the property that a time-shifted impulse function is transformed into a chirp function. This can have useful applications in the analysis of the device-under-test frequency response in electronic testing of analogue and mixed-signal circuits/systems.

Index Terms:

Electronic testing, DSP, spectral warping, chirp signal generation

Citation:

W. Allen, D. Bailey, S. Demidenko, V. Piuri, "Test Chirp Signal Generation Using Spectral Warping," delta, pp.492, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002

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