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The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
A Functional Approach to Test Cascaded BCD Counters
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
ASCII Text
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Gabriela Peretti, Eduardo Romero, Franco Salvático, Carlos Marqués, "A Functional Approach to Test Cascaded BCD Counters," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 408, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.
 
 
BibTex
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@article{ 10.1109/DELTA.2002.994660,
author = {Gabriela Peretti and Eduardo Romero and Franco Salvático and Carlos Marqués},
title = {A Functional Approach to Test Cascaded BCD Counters},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2002},
isbn = {0-7695-1453-7},
pages = {408},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994660},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - A Functional Approach to Test Cascaded BCD Counters
SN - 0-7695-1453-7
SP
EP
A1 - Gabriela Peretti,
A1 - Eduardo Romero,
A1 - Franco Salvático,
A1 - Carlos Marqués,
PY - 2002
KW - digital testing
KW - off-line built-in self-test
KW - functional test
KW - synchronous systems
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Gabriela Peretti, National University of Technology, Regional School at Villa Mar?
Eduardo Romero, National University of Technology, Regional School at Villa Mar?
Franco Salvático, National University of Technology, Regional School at Villa Mar?
Carlos Marqués, National University of C?rdoba
This work presents an off-line Built -In Self-Test for timing systems based on synchronous BCD counters. We adopt for this case study a functional approach, exploiting the functional characteristics of the modules in the system for test pattern generation. Different alternatives for test sequences, simulation and experimental results are shown. Fault coverage of 95% and 100% are obtained under different test sequences. The test time scales up linearly with the number of cascaded counters, and the hardware overhead becomes less significant as the number of counters increases.
Index Terms:
digital testing, off-line built-in self-test, functional test, synchronous systems
Citation:
Gabriela Peretti, Eduardo Romero, Franco Salvático, Carlos Marqués, "A Functional Approach to Test Cascaded BCD Counters," delta, pp.408, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
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