Test Socket Chip for Measuring Dark Current in IR FPA

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Meng-Lieh Sheu Articles by Tai-Ping Sun Articles by Far-Wen Jih

The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)

Christchurch, New Zealand

January 29-January 31

ISBN: 0-7695-1453-7

	ASCII Text	x
	Meng-Lieh Sheu, Tai-Ping Sun, Far-Wen Jih, "Test Socket Chip for Measuring Dark Current in IR FPA," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 167, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.

	BibTex	x
	@article{ 10.1109/DELTA.2002.994608, author = {Meng-Lieh Sheu and Tai-Ping Sun and Far-Wen Jih}, title = {Test Socket Chip for Measuring Dark Current in IR FPA}, journal ={Electronic Design, Test and Applications, IEEE International Workshop on}, volume = {0}, year = {2002}, isbn = {0-7695-1453-7}, pages = {167}, doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994608}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Electronic Design, Test and Applications, IEEE International Workshop on TI - Test Socket Chip for Measuring Dark Current in IR FPA SN - 0-7695-1453-7 SP EP A1 - Meng-Lieh Sheu, A1 - Tai-Ping Sun, A1 - Far-Wen Jih, PY - 2002 KW - Test Socket Chip KW - Infrared(IR) KW - Focal Plane Array(FPA) KW - Dark Current VL - 0 JA - Electronic Design, Test and Applications, IEEE International Workshop on ER -

Meng-Lieh Sheu, National Chi-Nan University

Tai-Ping Sun, National Chi-Nan University

Far-Wen Jih, National Chi-Nan University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994608

A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated.

Index Terms:

Test Socket Chip, Infrared(IR), Focal Plane Array(FPA), Dark Current

Citation:

Meng-Lieh Sheu, Tai-Ping Sun, Far-Wen Jih, "Test Socket Chip for Measuring Dark Current in IR FPA," delta, pp.167, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.