loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
A Method for Storing Fail Bit Maps in Burn-in Memory Testers
Christchurch, New Zealand
January 29-January 31
ISBN: 0-7695-1453-7
ASCII Text
x 
 
Atsumu Iseno, Yukihiro Iguchi, "A Method for Storing Fail Bit Maps in Burn-in Memory Testers," Electronic Design, Test and Applications, IEEE International Workshop on, pp. 142, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002.
 
 
BibTex
x
 
@article{ 10.1109/DELTA.2002.994603,
author = {Atsumu Iseno and Yukihiro Iguchi},
title = {A Method for Storing Fail Bit Maps in Burn-in Memory Testers},
journal ={Electronic Design, Test and Applications, IEEE International Workshop on},
volume = {0},
year = {2002},
isbn = {0-7695-1453-7},
pages = {142},
doi = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2002.994603},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Electronic Design, Test and Applications, IEEE International Workshop on
TI - A Method for Storing Fail Bit Maps in Burn-in Memory Testers
SN - 0-7695-1453-7
SP
EP
A1 - Atsumu Iseno,
A1 - Yukihiro Iguchi,
PY - 2002
VL - 0
JA - Electronic Design, Test and Applications, IEEE International Workshop on
ER -
 
Atsumu Iseno, Meiji University
Yukihiro Iguchi, Meiji University
Although fail bit maps in burn-in memory testers are important for analyzing process problems,we need very large storage for storing them. This paper present a method for compressing fail bit maps and storing them catch rams. We classify fail patterns under six types. Catch ram stores the fail types and their locations. Since proposed method is simple, it can be easy implemented in hardware on every DUT(device under test) board. A prototype has been developed by using an FPGA and an SRAM.
Citation:
Atsumu Iseno, Yukihiro Iguchi, "A Method for Storing Fail Bit Maps in Burn-in Memory Testers," delta, pp.142, The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02), 2002
Usage of this product signifies your acceptance of the Terms of Use.