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Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04)
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
ASCII Text
x 
 
Josep Rius V?zquez, Jos? Pineda de Gyvez, "Power Supply Noise Monitor for Signal Integrity Faults," Design, Automation and Test in Europe Conference and Exhibition, vol. 2, pp. 21406, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004.
 
 
BibTex
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@article{ 10.1109/DATE.2004.1269109,
author = {Josep Rius V?zquez and Jos? Pineda de Gyvez},
title = {Power Supply Noise Monitor for Signal Integrity Faults},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {2},
year = {2004},
issn = {1530-1591},
pages = {21406},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2004.1269109},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Power Supply Noise Monitor for Signal Integrity Faults
SN - 1530-1591
SP
EP
A1 - Josep Rius V?zquez,
A1 - Jos? Pineda de Gyvez,
PY - 2004
KW - null
VL - 2
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Josep Rius V?zquez, Universitat Polit?cnica de Catalunya
Jos? Pineda de Gyvez, Philips Research Laboratories
We propose a monitor able to detect on-line excessive Power Supply Noise (PSN) at the power/ground lines. It has high resolution (100 ps), enough to collect the important features of PSN and its output is isolated from the local PSN. It is useful for any scheme that takes corrective actions to prevent signal integrity faults after detection of excessive PSN.
Citation:
Josep Rius V?zquez, Jos? Pineda de Gyvez, "Power Supply Noise Monitor for Signal Integrity Faults," date, vol. 2, pp.21406, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004
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