loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04)
ULSI Interconnect Length Distribution Model Considering Core Utilization
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
Hidenari Nakashima, Tokyo Institute of Technology
Junpei Inoue, Tokyo Institute of Technology
Kenichi Okada, Tokyo Institute of Technology
Kazuya Masu, Tokyo Institute of Technology
Interconnect Length Distribution (ILD) represents a correlation between the number of interconnects and length. The ILD can predict power consumption, clock frequency, chip size, etc. It has been said that high core utilization and small circuit area improve chip performance. We propose a ILD model to predict a correlation between core utilization and chip performance. The proposed model predicts influences of interconnect length and interconnect density on circuit performances. As core utilization increases, small and simple circuits improve the performances. In large complex circuits, decrease of load capacitance is more important than that of total interconnect length for improvement of chip performance. The proposed ILD model expresses actual ILD more accurate than conventional models.
Citation:
Hidenari Nakashima, Junpei Inoue, Kenichi Okada, Kazuya Masu, "ULSI Interconnect Length Distribution Model Considering Core Utilization," date, vol. 2, pp.21210, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004
Usage of this product signifies your acceptance of the Terms of Use.