Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04) Soft Faults and the Importance of Stresses in Memory Testing Paris, France February 16-February 20 ISBN: 0-7695-2085-5
Memory testing in general, and DRAM testing in particular, has become greatly dependent on the modification of stresses (timing, temperature and voltages) in a way that is difficult to justify using the current understanding of memory faults. This paper introduces a new class of fault models (soft faults) based on a special classification of memory faults, that shows why it is fundamentally necessary to apply stresses. The paper calculates the relative probability of soft faults for a specific failure mechanism and compares this probability in DRAMs with that in SRAMs. In addition, the concept of soft faults is validated using defect injection and electrical simulation of a Spice DRAM model.
Index Terms:
Fault modeling, soft faults, memory testing, stress application, defect simulation
Citation:
Zaid Al-Ars, Ad J. van de Goor, "Soft Faults and the Importance of Stresses in Memory Testing," date, vol. 2, pp.21084, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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