Power density of high-end microprocessors has been increasing by approximately 80% per technology generation, while the voltage is scaling by a factor of 0.8. This leads to 225% increase in current per unit area in successive generation of technologies. The cost of maintaining the same IR drop becomes too high. This leads to compromise in power delivery and power grid becomes a performance limiter. Traditional performance related test techniques with transition and path delay fault models focus on testing the logic but not the power delivery. In this paper we view power grid as performance limiter and develop a fault model to address the problem of vector generation for delay faults arising out of power delivery problems. A fault extraction methodology applied to a microprocessor design block is explained.