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Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04)
Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
ASCII Text
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Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer, "Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects," Design, Automation and Test in Europe Conference and Exhibition, vol. 2, pp. 21066, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004.
 
 
BibTex
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@article{ 10.1109/DATE.2004.1269034,
author = {Jennifer Dworak and Brad Cobb and James Wingfield and M. Ray Mercer},
title = {Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {2},
year = {2004},
issn = {1530-1591},
pages = {21066},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2004.1269034},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects
SN - 1530-1591
SP
EP
A1 - Jennifer Dworak,
A1 - Brad Cobb,
A1 - James Wingfield,
A1 - M. Ray Mercer,
PY - 2004
KW - null
VL - 2
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Jennifer Dworak, Texas A&M University
Brad Cobb, Texas A&M University
James Wingfield, Texas A&M University
M. Ray Mercer, Texas A&M University
Dynamic defects are less likely to be fortuitously detected than static defects because they have more stringent detection requirements. We show that (in addition to more site observations) balanced excitation is essential for detection of these defects, and we present a metric for estimating this degree of balance. We also show that excitation balance correlates with the parameter τ in the MPG-D defective part level model.
Citation:
Jennifer Dworak, Brad Cobb, James Wingfield, M. Ray Mercer, "Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects," date, vol. 2, pp.21066, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004
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