Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04)
Synthesis for Manufacturability: A Sanity Check
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
As we move towards nanometer technology, manufacturing problems become overwhelmingly difficult to solve. Presently, optimization for manufacturability is performed at a post-synthesis stage and has been shown capable of reducing manufacturing cost up to 10%. As in other cases, raising the abstraction layer where optimization is applied is expected to yield substantial gains. This paper focuses on a new approach to design for manufacturability: logic synthesis for manufacturability. This methodology consists of replacing the traditional area-driven technology mapping with a new manufacturability-driven one. We leverage existing logic synthesis tools to test our method. The results obtained by using STMicroelectronics 0.13?m library confirm that this approach is a promising solution for designing circuits with lower manufacturing cost, while retaining performance. Finally, we show that our synthesis for manufacturability can achieve even larger cost reduction when yield-optimized cells are added to the library, thus enabling a wider area-yield tradeoff exploration.
Citation:
Alessandra Nardi, Alberto L. Sangiovanni-Vincentelli, "Synthesis for Manufacturability: A Sanity Check," date, vol. 2, pp.20796, Design, Automation and Test in Europe Conference and Exhibition Volume II (DATE'04), 2004