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Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04)
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
ASCII Text
x 
 
Luca Benini, Alessandro Ivaldi, Alberto Macii, Enrico Macii, "Block-Enabled Memory Macros: Design Space Exploration and Application-Specific Tuning," Design, Automation and Test in Europe Conference and Exhibition, vol. 1, pp. 10698, Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04), 2004.
 
 
BibTex
x
 
@article{ 10.1109/DATE.2004.1268936,
author = {Luca Benini and Alessandro Ivaldi and Alberto Macii and Enrico Macii},
title = {Block-Enabled Memory Macros: Design Space Exploration and Application-Specific Tuning},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {1},
year = {2004},
issn = {1530-1591},
pages = {10698},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2004.1268936},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - Block-Enabled Memory Macros: Design Space Exploration and Application-Specific Tuning
SN - 1530-1591
SP
EP
A1 - Luca Benini,
A1 - Alessandro Ivaldi,
A1 - Alberto Macii,
A1 - Enrico Macii,
PY - 2004
KW - null
VL - 1
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Luca Benini, Università di Bologna
Alessandro Ivaldi, Politecnico di Torino
Alberto Macii, Politecnico di Torino
Enrico Macii, Politecnico di Torino
In this paper, we propose a combined solution that allows us to customize the architecture of internally partitioned SRAM macros according to the given application be executed. Energy savings with respect to monolithic memory configurations are above 40%, without access time violation.
Citation:
Luca Benini, Alessandro Ivaldi, Alberto Macii, Enrico Macii, "Block-Enabled Memory Macros: Design Space Exploration and Application-Specific Tuning," date, vol. 1, pp.10698, Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04), 2004
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