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Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04)
Exploring Logic Block Granularity for Regular Fabrics
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
A. Koorapaty, Carnegie Mellon University
V. Kheterpal, Carnegie Mellon University
P. Gopalakrishnan, Carnegie Mellon University
M. Fu, Carnegie Mellon University
L. Pileggi, Carnegie Mellon University
Driven by the economics of design and manufacturing nanoscale integrated circuits, an emphasis is being placed on developing new, regular logic fabrics that leverage the regularity and programmability of FPGAs, yet deliver a level of performance and density close to ASICs. One example of such a fabric is a Via-Patterned Gate Array (VPGA) [9], which employs ASIC style global routing on top of an array of patternable logic blocks (PLBs). Previous work [8], [6], [10] showed that by employing even limited heterogeneity for the VPGA logic blocks, namely combining a 3-LUT with two 3-input Nand gates, one can achieve performance comparable to that provided by standard cells. Since the area cost for such heterogenity is far less for a VPGA than for SRAM programmed fabrics such as FPGAs, we can explore new configurations of via-configurable logic blocks that offer greater heterogenity and granularity to achieve even higher performance. In this paper, we present a new, more granular, via-patterned heterogeneous logic block architecture and compare it to a less granular LUT-based heterogeneous PLB. Our results show higher performance and more effective packing of the logic functions due to increased granularity.
Citation:
A. Koorapaty, V. Kheterpal, P. Gopalakrishnan, M. Fu, L. Pileggi, "Exploring Logic Block Granularity for Regular Fabrics," date, vol. 1, pp.10468, Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04), 2004
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