Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04) A Method for Parameter Extraction of Analog Sine-Wave Signals for Mixed-Signal Built-In-Self-Test Applications Paris, France February 16-February 20 ISBN: 0-7695-2085-5
This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analog sine-wave signal. The required circuitry for on-chip implementation is very simple and robust, which makes the present approach very suitable for BIST applications. Solutions in this sense are addressed together with simulation results that validate the feasibility of the proposed approach.
Citation:
Diego V?zquez, Gildas Leger, Gloria Huertas, Adoraci? Rueda, Jos? L. Huertas, "A Method for Parameter Extraction of Analog Sine-Wave Signals for Mixed-Signal Built-In-Self-Test Applications," date, vol. 1, pp.10298, Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04), 2004 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||