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Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04)
Random Jitter Extraction Technique in a Multi-Gigahertz Signal
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
Chee-Kian Ong, University of California at Santa Barbara
Dongwoo Hong, University of California at Santa Barbara
Kwang-Ting (Tim) Cheng, University of California at Santa Barbara
Li-C Wang, University of California at Santa Barbara
In this paper, we propose a simple technique for estimating the standard deviation of a Gaussian random jitter component in a multi-gigahertz signal. This method may utilize existing on-chip single-shot period measurement techniques to measure the multi-gigahertz signal periods for the estimation. This method does not require an external sampling clock, nor any additional measurement beyond existing techniques. Experimental results show that this extraction method can accurately estimate the random jitter variance in a multi-gigahertz signal even with the presence of a few hundred-hertz sinusoidal jitter components.
Citation:
Chee-Kian Ong, Dongwoo Hong, Kwang-Ting (Tim) Cheng, Li-C Wang, "Random Jitter Extraction Technique in a Multi-Gigahertz Signal," date, vol. 1, pp.10286, Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04), 2004
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