Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04)
Level of Similarity: A Metric for Fault Collapsing
Paris, France
February 16-February 20
ISBN: 0-7695-2085-5
We describe a new approach to fault collapsing that extends fault collapsing based on fault equivalence and fault dominance. The new approach is based on a metric called level of similarity between faults. Informally, a fault fj is said to be similar to a fault fi with a level of similarity SLi,j ? ≤ 1 if a fraction SLi,j of the tests for fi also detect fj. If SLi,j is high enough, one may exclude fj from the set of target faults and rely on the test for fi (and tests for other faults) to detect fj. We describe a procedure for fault collapsing based on the level of similarity, and study its effectiveness experimentally.
Citation:
Irith Pomeranz, Sudhakar M. Reddy, "Level of Similarity: A Metric for Fault Collapsing," date, vol. 1, pp.10056, Design, Automation and Test in Europe Conference and Exhibition Volume I (DATE'04), 2004