loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Design, Automation and Test in Europe Conference and Exhibition (DATE'03 Designers' Forum)
A System to Validate and Certify Soft and Hard IP
Munich, Germany
March 03-March 07
ISBN: 0-7695-1870-2
ASCII Text
x 
 
Bernard Laurent, Thierry Karger, "A System to Validate and Certify Soft and Hard IP," Design, Automation and Test in Europe Conference and Exhibition, vol. 2, pp. 20208, Design, Automation and Test in Europe Conference and Exhibition (DATE'03 Designers' Forum), 2003.
 
 
BibTex
x
 
@article{ 10.1109/DATE.2003.10232,
author = {Bernard Laurent and Thierry Karger},
title = {A System to Validate and Certify Soft and Hard IP},
journal ={Design, Automation and Test in Europe Conference and Exhibition},
volume = {2},
year = {2003},
issn = {1530-1591},
pages = {20208},
doi = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10232},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Design, Automation and Test in Europe Conference and Exhibition
TI - A System to Validate and Certify Soft and Hard IP
SN - 1530-1591
SP
EP
A1 - Bernard Laurent,
A1 - Thierry Karger,
PY - 2003
KW - null
VL - 2
JA - Design, Automation and Test in Europe Conference and Exhibition
ER -
 
Bernard Laurent, Synopsys, Inc.
Thierry Karger, STMicroelectronics
With the incr easing use of Intellectual Property (IP) in the semiconductor industry, the demand to verify IP for quality is high. This paper describes ipscreen, a software tool that aims to both validate and certify IP. Although extendable to all kinds of flows, checks and commercial tools, ipscreen has been primarily designed to comply with the standards that designs produced within STMicroelectronics must adhere to. Both soft and hard IP are targeted.
Citation:
Bernard Laurent, Thierry Karger, "A System to Validate and Certify Soft and Hard IP," date, vol. 2, pp.20208, Design, Automation and Test in Europe Conference and Exhibition (DATE'03 Designers' Forum), 2003
Usage of this product signifies your acceptance of the Terms of Use.